Normal view MARC view ISBD view

Scanning Electron Microscopy

WELLS, OLIVER C

Scanning Electron Microscopy - New York McGraw-Hill book company 1974

Subjects--Topical Terms:
METALLURGICAL AND MATERIALS ENGINEERING
SCANNING ELECTRON MICROSCOPY

Dewey Class. No.: F191:C9B5) / WEL L4

Print
Add to your cart (remove)
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Scanning Electron Microscopy

©2023 Central Library, Malaviya National Institute of Technology Jaipur