Field -Ion Microscopy (Record no. 13897)

MARC details
000 -LEADER
fixed length control field 00490pam a2200145a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 140414b1968 xxu||||| |||| 00| 0 eng d
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number F191:(C5)
Item number HRE
245 ## - TITLE STATEMENT
Title Field -Ion Microscopy
Statement of responsibility, etc. edited by HREN, JOHN J. ; RANGANATHAN, S.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. NEW YORK
Name of publisher, distributor, etc. PLENUM PRESS
Date of publication, distribution, etc. 1968
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element FIELD EMISSION AND FIELD
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element METALLURGICAL AND MATERIALS ENGINEERING
690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN)
Topical term or geographic name as entry element METALLURGICAL AND MATERIALS ENGINEERING
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name HREN, JOHN J. ; RANGANATHAN, S.
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 14392
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Shelving location Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
        Malaviya National Institute of Technology Malaviya National Institute of Technology   30/10/2012   F191:(C5) HRE 14980 15/04/2014 15/04/2014 General Books