Digital Circuit Testing and Testability (Record no. 15877)

MARC details
000 -LEADER
fixed length control field 00454pam a2200145a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 140414b1935 xxu||||| |||| 00| 0 eng d
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.395
Item number LAL
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name LALA, PARAG K
245 ## - TITLE STATEMENT
Title Digital Circuit Testing and Testability
Statement of responsibility, etc.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. San Diego
Name of publisher, distributor, etc. Academic Press
Date of publication, distribution, etc. 1935
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element FAULTS IN DIGITAL CIRCUTS
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element ENGINEERINGICROELECTRONICS<br/><br/>COMMUNICATION
690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN)
Topical term or geographic name as entry element ELECTRONICS AND COMMUNICATION ENGINEERING
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 16443
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Shelving location Date acquired Total Checkouts Full call number Barcode Checked out Date last seen Date checked out Price effective from Koha item type
        Malaviya National Institute of Technology Malaviya National Institute of Technology   09/11/2012   621.395 LAL 56886 27/02/2013 15/04/2014 16/01/2013 15/04/2014 General Books