Wafer-Level Testing and During Burn-in for Integrated Circuits (Record no. 4765)

MARC details
000 -LEADER
fixed length control field 00534pam a2200169a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 140414b2010 xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781596939899
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Item number BAH
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name BAHUKUDUMBI, SUDARSHAN
245 ## - TITLE STATEMENT
Title Wafer-Level Testing and During Burn-in for Integrated Circuits
Statement of responsibility, etc.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. London
Name of publisher, distributor, etc. Artech House
Date of publication, distribution, etc. 2010
300 ## - PHYSICAL DESCRIPTION
Extent xv,198p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element INTEGRATED CIRCUITS--WAFER-SCALE INTEGRATION
690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN)
Topical term or geographic name as entry element ELECTRONICS AND COMMUNICATION ENGINEERING
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name CHAKRABARTY, KRISHNENDU
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 5024
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Shelving location Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
        Malaviya National Institute of Technology Malaviya National Institute of Technology   14/09/2012   621.3815 BAH 79139 15/04/2014 15/04/2014 General Books