Normal view MARC view ISBD view

High Level Test Synthesis of Digital VLSI Circuits

By: LEE, MIKE TIEN-CHIEN.
Material type: materialTypeLabelBookPublisher: London Artech House 1997Subject(s): DIGITAL VLSI CIRCUITS, MECHANICAL ENGINEERING | MECHANICAL ENGINEERING
    average rating: 0.0 (0 votes)
Item type Current location Call number Status Date due Barcode
General Books General Books Malaviya National Institute of Technology
(Browse shelf) Available 57060

There are no comments for this item.

Log in to your account to post a comment.