Search

Image from Google Jackets

Normal view MARC view ISBD view

Fault-Tolerance and Reliability Techniques for High Density Random Access Memories

By: CHAKRABORTY, KANADContributor(s): MAZUMDAR, PINAKIMaterial type: Text

Text

TextPublication details: NEW DELHI PRENTICE HALL OF INDIA 2002 Subject(s): FULL TOLERANCE | RELIABILITY TECHNIQUES | RANDOM ACCESS MEMORIES | COMPUTER ENGINEERINGDDC classification: 621.395

Average rating: 0.0 (0 votes)

Holdings ( 1 )
Comments ( 0 )

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
General Books	Malaviya National Institute of Technology	621.395 CHA (Browse shelf(Opens below))	Available		61065

Browsing Malaviya National Institute of Technology shelves Close shelf browser (Hides shelf browser)

Previous	No cover image available	No cover image available	No cover image available	No cover image available	No cover image available	No cover image available	No cover image available	Next
Previous	621.395 BIS Logic Design Theory	621.395 BIS Logic Design Theory	621.395 BIS Logic Design Theory	621.395 CHA Fault-Tolerance and Reliability Techniques for High Density Random Access Memories	621.395 COM Computer Aided Tools for VLSI System Design	621.395 COM Digital Logic State Machine Design	621.395 COU Operational Amplifiers and Linear Interated Circuits	Next

There are no comments on this title.

to post a comment.

Share

©2023 Central Library, Malaviya National Institute of Technology Jaipur