Search

Image from Google Jackets

Normal view MARC view ISBD view

The European Design and Test Confrence

By: IEEE COMPUTER SOCIETY PRESSMaterial type: Text

Text

TextPublication details: California IEEE Computer Society Press 1995 Description: 605pSubject(s): EUROPEAN DESIGN , ELECTRONICS AND COMMUNICATION ENGINEERING | ELECTRONICS AND COMMUNICATION ENGINEERINGDDC classification: 621.38

Average rating: 0.0 (0 votes)

Holdings ( 1 )
Comments ( 0 )

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
General Books	Malaviya National Institute of Technology	621.38 IEE (Browse shelf(Opens below))	Available		54687

Browsing Malaviya National Institute of Technology shelves Close shelf browser (Hides shelf browser)

Previous	No cover image available	No cover image available	No cover image available	No cover image available	No cover image available	No cover image available		Next
Previous	621.38 ARN ADVANCED OPTICAL WIRELESS COMMUNICATION SYSTEMS	621.38 BIN EMERGING TECHNOLOGIES IN WIRELESS LANs	621.38 DJO CODING FOR OPTICALS CHANNEL	621.38 IEE The European Design and Test Confrence	621.38 SUN STRAIN EFFECT IN SEMICONDUCTORS	621.38 WAL High-Performence Communition Network	621.381 5 GRA Analog Layout Synthesis	Next

There are no comments on this title.

to post a comment.

Share

©2023 Central Library, Malaviya National Institute of Technology Jaipur