SYSTEM ON CHIP TEST ARCHITECTURES NANOMETER DESIGN FOR TESTABILITY
Material type: TextPublication details: New Delhi Elsevier 2008 Subject(s): SYSTEM ON CHIP TEST ARCHITECTURES | ARCHITECTURE | ARCHITECTUREDDC classification: 621.395Item type | Current library | Call number | Status | Date due | Barcode |
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General Books | Malaviya National Institute of Technology | 621.395 WAN (Browse shelf(Opens below)) | Available | 73618 |
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338 PAR INFRASTRUCTURE PLANNING | 343.41072 SPE Architect's Legal Handbook | 604.2 YAR The motive technical drawing with design | 621.395 WAN SYSTEM ON CHIP TEST ARCHITECTURES | 658.7 SAH Indian Supply Architecture | 658.91 WIG Residential Real Estate Practice | 684.18 MAR Building Garden Furniture |
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