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SYSTEM ON CHIP TEST ARCHITECTURES NANOMETER DESIGN FOR TESTABILITY

By: WANG , LAUNG TERNGContributor(s): TOUBA, NUR A | STROUD, CHARLES EMaterial type: TextTextPublication details: New Delhi Elsevier 2008 Subject(s): SYSTEM ON CHIP TEST ARCHITECTURES | ARCHITECTURE | ARCHITECTUREDDC classification: 621.395
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