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Characterization of materials,v-3\ editor-in-chief, Elton N. Kaufmann, Argonne National Laboratory, Argonne, IL.

Contributor(s): Kaufmann, Elton N [editor of compilation].
Material type: materialTypeLabelBookPublisher: Hoboken, New Jersey : John Wiley & Sons, Inc., [2012]Edition: Second edition.Description: vii,2393 p. illustrations ; 29 cm.ISBN: 9781118110744 (3 volume set); 1118110749 (3 volume set); 9781118414453 (volume 1); 9781118414460 (volume 2); 9781118414477 (volume 3).Subject(s): Metallurgical and material engineering | Materials -- Research | Materials -- Testing | TECHNOLOGY & ENGINEERING / Material ScienceDDC classification: 620.110 287 Other classification: TEC021000 Summary: "A thoroughly updated and expanded new edition, this work features a logical, detailed, and self-contained coverage of the latest materials characterization techniques. Reflecting the enormous progress in the field since the last edition, this book details a variety of new powerful and accessible tools, improvements in methods arising from new instrumentation and approaches to sample preparation, and characterization techniques for new types of materials, such as nanomaterials. Researchers in materials science and related fields will be able to identify and apply the most appropriate method in their work"--
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General Books General Books Malaviya National Institute of Technology
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620.110 287 KAU (Browse shelf) Available 83771

First edition published as a two volume set, ©2003.

Includes bibliographical references and index.

"A thoroughly updated and expanded new edition, this work features a logical, detailed, and self-contained coverage of the latest materials characterization techniques. Reflecting the enormous progress in the field since the last edition, this book details a variety of new powerful and accessible tools, improvements in methods arising from new instrumentation and approaches to sample preparation, and characterization techniques for new types of materials, such as nanomaterials. Researchers in materials science and related fields will be able to identify and apply the most appropriate method in their work"--

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