Microelectronics and Reliability ; Vol. 32 : An International Journal & World Abstracting Service
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TextPublication details: Oxford Pergamon 1992 Description: No. 01 -06ISSN: 00262714Subject(s): Electronics & Communication EngineerngDDC classification: 621.381 05
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Bound Volume
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Malaviya National Institute of Technology | 621.381 05 PER (Browse shelf(Opens below)) | Available | P10490 |
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| 621.381.045 SIN OPTOELECTRONICS | 621.381 045 SIN Optoelectronics: An Introduction to Materials and Devices | 621.381 045 WIL Optoelecteonics | 621.381 05 PER Microelectronics and Reliability ; Vol. 32 : An International Journal & World Abstracting Service | 621.381.05 V.136 IEE Proceedings-B Electric Power Applications | 621.381 072 4 SUB, E-2 Experiments in Electronics | 621.381 3 GUP Microwaves |
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