TY  - BOOK
AU  - TSUI, FRANK F
TI  - LSI/VLSI Testability Design
U1  - 621.3950287 
PY  - 1987///
CY  - Delhi
PB  - McGraw-Hill
KW  -  INTEGRATED CIRCUITS-VERY LARGE SCALE
KW  - INTEGRATED CIRCUITS -LARGE SCALE INTEGRATION-TESTING
ER  -