TY  - BOOK
AU  - LALA, PARAG K
TI  - Digital Circuit Testing and Testability
U1  - 621.395 
PY  - 1935///
CY  - San Diego
PB  - Academic Press
KW  -  FAULTS IN DIGITAL CIRCUTS
KW  - ENGINEERINGICROELECTRONICS

COMMUNICATION
ER  -