TY  - BOOK
AU  - BAHUKUDUMBI, SUDARSHAN
AU  - CHAKRABARTY, KRISHNENDU
TI  - Wafer-Level Testing and During Burn-in for Integrated Circuits
SN  - 9781596939899
U1  - R 621.381 
PY  - 2010///
CY  - London
PB  - Artech House
KW  - INTEGRATED CIRCUITS--WAFER-SCALE INTEGRATION
ER  -