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Fault-Tolerance and Reliability Techniques for High- Density Random- Access Memories

by CHAKRABORTY, KANAD | MAZUMDER, PINAKI.

Material type: Text Text; Format: print ; Literary form: Not fiction Publication details: New Delhi Pearson Education 2002Availability: Items available for loan: Malaviya National Institute of Technology (1)Call number: 621.3191 CHA.

Genetic Algorithms

by MAZUMDER, PINAKI | RUDNICK, ELIZABETH M.

Material type: Text Text; Format: print ; Literary form: Not fiction Publication details: New Delhi Pearson Education 1999Availability: Items available for loan: Malaviya National Institute of Technology (5)Call number: 005.1 MAZ, ...

Genetic Algorithms

by MAZUMDER, PINAKI | RUDNICK, ELIZABETH M.

Material type: Text Text; Format: print ; Literary form: Not fiction Publication details: New Delhi Pearson Education 1999Availability: Items available for loan: Malaviya National Institute of Technology (2)Call number: 006.31 MAZ, ...

GENETIC ALGORITHMS FOR VLSI DESIGN, LAYOUT AND TEST AUTOMATION

by MAZUMDER, PINAKI | RUDNICK, ELIZABETH M.

Material type: Text Text; Format: print ; Literary form: Not fiction Publication details: New Delhi Pearson Education 1999Availability: Items available for loan: Malaviya National Institute of Technology (1)Call number: 005.1 MAZ.

Genetic Algorithms for VLSI Design , layout & test automation

by MAZUMDER, PINAKI | RUDNICK, ELIZABETH M.

Material type: Text Text; Format: print ; Literary form: Not fiction Publication details: New Delhi Pearson Education 1999Availability: Not available: Malaviya National Institute of Technology: Damaged (1).

Genetic algorithms for vlsi design, layout and test automation

by Mazumder, Pinaki | Rudnick, Elizabeth.

Material type: Text Text; Format: print ; Literary form: Not fiction Publication details: Noida Pearson education c1999Availability: Items available for loan: Malaviya National Institute of Technology (1)Call number: 005.1 MAZ.

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