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		No cover image available Digital Circuit Testing and Testability by LALA, PARAG K. Material type: Text; Format: print ; Literary form: Not fiction Publication details: San Diego Academic Press 1935Availability: Not available: Malaviya National Institute of Technology: Checked out (1). Add to cart (remove)
		No cover image available Fault Tolerant and Fault Testable Hardware Design by LALA, PARAG K. Material type: Text; Format: print ; Literary form: Not fiction Publication details: Hyderabad BS Publications 1990Availability: Items available for loan: Malaviya National Institute of Technology (1)Call number: 004.2 LAL. Add to cart (remove)
		No cover image available Self -Checking And Fault - Tolerant Digital Desigan by LALA , PARAG K. Material type: Text; Format: print ; Literary form: Not fiction Publication details: San Francisco Morgan kaufmann 2001Availability: Items available for loan: Malaviya National Institute of Technology (1)Call number: 004.2 LAL. Add to cart (remove)
		No cover image available Digital System Desigan Using Programmable Logic Devices by LALA , PARAG K. Material type: Text; Format: print ; Literary form: Not fiction Publication details: Hyderabad BS Publications 1990Availability: Items available for loan: Malaviya National Institute of Technology (1)Call number: 005.155 LAL. Add to cart (remove)

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