Process control system fault diagnosis : a Bayesian approach by Gonzalez, Ruben | Qi, Fei | Huang, Biao.
Material type: 
Text; Format:
print
; Literary form:
Not fiction
Publication details: London John Wiley & Sons c2016Availability: Items available for reference: Malaviya National Institute of Technology: Not for loan (1)Call number: R660.2815 GON.
