| 000 | 00464pam a2200157a 44500 | ||
|---|---|---|---|
| 008 | 140414b1987 xxu||||| |||| 00| 0 eng d | ||
| 082 |
_a621.3950287 _bTSU |
||
| 100 | _aTSUI, FRANK F | ||
| 245 |
_aLSI/VLSI Testability Design _c |
||
| 260 |
_aDelhi _bMcGraw-Hill _c1987 |
||
| 300 | _a702p. | ||
| 650 | _a INTEGRATED CIRCUITS-VERY LARGE SCALE | ||
| 650 | _aINTEGRATED CIRCUITS -LARGE SCALE INTEGRATION-TESTING | ||
| 690 | _aELECTRICAL ENGINEERING | ||
| 906 | _a12266 | ||
| 999 |
_c11817 _d11817 |
||