| 000 | 00490pam a2200145a 44500 | ||
|---|---|---|---|
| 008 | 140414b1968 xxu||||| |||| 00| 0 eng d | ||
| 082 |
_aF191:(C5) _bHRE |
||
| 245 |
_aField -Ion Microscopy _cedited by HREN, JOHN J. ; RANGANATHAN, S. |
||
| 260 |
_aNEW YORK _bPLENUM PRESS _c1968 |
||
| 650 | _a FIELD EMISSION AND FIELD | ||
| 650 | _aMETALLURGICAL AND MATERIALS ENGINEERING | ||
| 690 | _aMETALLURGICAL AND MATERIALS ENGINEERING | ||
| 700 | _aHREN, JOHN J. ; RANGANATHAN, S. | ||
| 906 | _a14392 | ||
| 999 |
_c13897 _d13897 |
||