000 00394pam a2200133a 44500
008 140414b1974 xxu||||| |||| 00| 0 eng d
082 _aD65:81
_bJOW
100 _aJOWETT, C E
245 _aSemiconductor Devices Testing and Evaluation
_c
260 _aLondon
_bBusiness Publications
_c1974
650 _aSEMICONDUCTORS,ECE
690 _aELECTRONICS AND COMMUNICATION ENGINEERING
906 _a15757
999 _c15220
_d15220