| 000 | 00524pam a2200133a 44500 | ||
|---|---|---|---|
| 008 | 140414b1997 xxu||||| |||| 00| 0 eng d | ||
| 082 |
_a621.392 _bABR |
||
| 245 |
_aDigital Systems Testing and Testable Design _cedited by ABRAMOVICI, MIRON; BREUER, MELVIN A; FRIEDMAN, ARTHUR D |
||
| 260 |
_aMumbai _bJAICO PUBLISHING HOUSE _c1997 |
||
| 650 | _aDIGITAL INTEGRATED CIRCUITS --TESTING. | ||
| 690 | _aELECTRONICS AND COMMUNICATION ENGINEERING | ||
| 700 | _aABRAMOVICI, MIRON; BREUER, MELVIN A; FRIEDMAN, ARTHUR D | ||
| 906 | _a15805 | ||
| 999 |
_c15266 _d15266 |
||