000 00454pam a2200145a 44500
008 140414b1935 xxu||||| |||| 00| 0 eng d
082 _a621.395
_bLAL
100 _aLALA, PARAG K
245 _aDigital Circuit Testing and Testability
_c
260 _aSan Diego
_bAcademic Press
_c1935
650 _a FAULTS IN DIGITAL CIRCUTS
650 _aENGINEERINGICROELECTRONICS COMMUNICATION
690 _aELECTRONICS AND COMMUNICATION ENGINEERING
906 _a16443
999 _c15877
_d15877