000 00570pam a2200157a 44500
008 140414b2001 xxu||||| |||| 00| 0 eng d
082 _a621.381
_bABR
245 _aDigital Systems Testing and Testable Deign
_cedited by ABRAMOVICI, MIRON; BREUER, MELVIN A; FRIEDMAN, ARTHUR D
260 _aMumbai
_bJAICO PUBLISHING HOUSE
_c2001
650 _a ELECTRONICS
650 _a TESTABLE DESIGN
650 _aDIGITAL SYSTEMS TESTING
690 _aELECTRONICS AND COMMUNICATION ENGINEERING
700 _aABRAMOVICI, MIRON; BREUER, MELVIN A; FRIEDMAN, ARTHUR D
906 _a33518
999 _c31902
_d31902