000 | 00570pam a2200157a 44500 | ||
---|---|---|---|
008 | 140414b2001 xxu||||| |||| 00| 0 eng d | ||
082 |
_a621.381 _bABR |
||
245 |
_aDigital Systems Testing and Testable Deign _cedited by ABRAMOVICI, MIRON; BREUER, MELVIN A; FRIEDMAN, ARTHUR D |
||
260 |
_aMumbai _bJAICO PUBLISHING HOUSE _c2001 |
||
650 | _a ELECTRONICS | ||
650 | _a TESTABLE DESIGN | ||
650 | _aDIGITAL SYSTEMS TESTING | ||
690 | _aELECTRONICS AND COMMUNICATION ENGINEERING | ||
700 | _aABRAMOVICI, MIRON; BREUER, MELVIN A; FRIEDMAN, ARTHUR D | ||
906 | _a33518 | ||
999 |
_c31902 _d31902 |