000 00437pam a2200133a 44500
008 140414b1982 xxu||||| |||| 00| 0 eng d
082 _a620.0045205
_bIEE
110 _aIEEE
245 _aIEEE Transaction on Reliability V 31, April 1982
_c
260 _aNEW JERSEY
_bINSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEER INC
_c1982
650 _aIEEE TRANSACTION ON RELIABILITY V 31, APRIL 1982
690 _aMATERIALS SCIENCE
906 _a39755
999 _c37669
_d37669