000 | 00653pam a2200181a 44500 | ||
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008 | 140414b2009 xxu||||| |||| 00| 0 eng d | ||
100 | _aAGRAWAL, RENU | ||
245 |
_aTEST SCHEME FOR FLASH MEMORY ARRAY USING FUNCTIONAL MODEL OF DUAL-GATE MOSFET _cedited by SAHULA, VINEET ; KUMAWAT, RENU |
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260 |
_aJAIPUR _bDEPARTMENT OF ECE, MNIT _c2009 |
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650 | _a PROJECT REPORT | ||
650 | _a RENU AGRAWAL | ||
650 | _a TEST SCHEME FOR FLASH MEMORY ARRAY | ||
650 | _a VLSI | ||
650 | _aELECTRONICS AND COMMUNICATION ENGINEERING | ||
690 | _aELECTRONICS AND COMMUNICATION ENGINEERING | ||
700 | _aSAHULA, VINEET ; KUMAWAT, RENU | ||
906 | _a64399 | ||
999 |
_c58594 _d58594 |