000 00474nam a22001817a 4500
008 140901b2014 xxu||||| |||| 00| 0 eng d
020 _a978935093194
082 _a621.37
_bBAK
100 _aBakshi,U A
245 _aElectrical measurements
_bA conceptual approach
260 _aDelhi
_bTechnical publication
_cc2014
300 _axix, p.
600 _aElectronics engineering
650 _aMeasurements
700 _aBakshi,A V
700 _aBakshi,K A
942 _cBK
999 _c60703
_d60703