LSI/VLSI Testability Design
TSUI, FRANK F
LSI/VLSI Testability Design - Delhi McGraw-Hill 1987 - 702p.
INTEGRATED CIRCUITS-VERY LARGE SCALE
INTEGRATED CIRCUITS -LARGE SCALE INTEGRATION-TESTING
621.3950287 / TSU
LSI/VLSI Testability Design - Delhi McGraw-Hill 1987 - 702p.
INTEGRATED CIRCUITS-VERY LARGE SCALE
INTEGRATED CIRCUITS -LARGE SCALE INTEGRATION-TESTING
621.3950287 / TSU