LSI/VLSI Testability Design (Record no. 11817)

MARC details
000 -LEADER
fixed length control field 00464pam a2200157a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 140414b1987 xxu||||| |||| 00| 0 eng d
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3950287
Item number TSU
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name TSUI, FRANK F
245 ## - TITLE STATEMENT
Title LSI/VLSI Testability Design
Statement of responsibility, etc.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. Delhi
Name of publisher, distributor, etc. McGraw-Hill
Date of publication, distribution, etc. 1987
300 ## - PHYSICAL DESCRIPTION
Extent 702p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element INTEGRATED CIRCUITS-VERY LARGE SCALE
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element INTEGRATED CIRCUITS -LARGE SCALE INTEGRATION-TESTING
690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN)
Topical term or geographic name as entry element ELECTRICAL ENGINEERING
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 12266
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Shelving location Date acquired Total Checkouts Total Renewals Full call number Barcode Date last seen Date checked out Price effective from Koha item type
        Malaviya National Institute of Technology Malaviya National Institute of Technology   18/10/2012 3 2 621.3950287 TSU 41956 15/09/2016 26/07/2016 15/04/2014 General Books