System-on-chip test architectures :
System-on-chip test architectures : nanometer design for testability /
edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
- Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
- xxxvi, 856 p. : ill. ; 25 cm.
- The Morgan Kaufmann series in systems on silicon .
Includes bibliographical references and index.
9780123739735 (hardcover : alk. paper)
Systems on a chip--Testing.
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Design.
621.395
Includes bibliographical references and index.
9780123739735 (hardcover : alk. paper)
Systems on a chip--Testing.
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Design.
621.395