TEST SCHEME FOR FLASH MEMORY ARRAY USING FUNCTIONAL MODEL OF DUAL-GATE MOSFET (Record no. 58594)
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000 -LEADER | |
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fixed length control field | 00653pam a2200181a 44500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 140414b2009 xxu||||| |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | AGRAWAL, RENU |
245 ## - TITLE STATEMENT | |
Title | TEST SCHEME FOR FLASH MEMORY ARRAY USING FUNCTIONAL MODEL OF DUAL-GATE MOSFET |
Statement of responsibility, etc. | edited by SAHULA, VINEET ; KUMAWAT, RENU |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Place of publication, distribution, etc. | JAIPUR |
Name of publisher, distributor, etc. | DEPARTMENT OF ECE, MNIT |
Date of publication, distribution, etc. | 2009 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | PROJECT REPORT |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | RENU AGRAWAL |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | TEST SCHEME FOR FLASH MEMORY ARRAY |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | VLSI |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | ELECTRONICS AND COMMUNICATION ENGINEERING |
690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
Topical term or geographic name as entry element | ELECTRONICS AND COMMUNICATION ENGINEERING |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | SAHULA, VINEET ; KUMAWAT, RENU |
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
a | 64399 |
Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
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Dewey Decimal Classification | Malaviya National Institute of Technology | Malaviya National Institute of Technology | 07/01/2014 | EV066 | 15/04/2014 | 15/04/2014 | Project Reports |