TEST SCHEME FOR FLASH MEMORY ARRAY USING FUNCTIONAL MODEL OF DUAL-GATE MOSFET (Record no. 58594)

MARC details
000 -LEADER
fixed length control field 00653pam a2200181a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 140414b2009 xxu||||| |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name AGRAWAL, RENU
245 ## - TITLE STATEMENT
Title TEST SCHEME FOR FLASH MEMORY ARRAY USING FUNCTIONAL MODEL OF DUAL-GATE MOSFET
Statement of responsibility, etc. edited by SAHULA, VINEET ; KUMAWAT, RENU
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. JAIPUR
Name of publisher, distributor, etc. DEPARTMENT OF ECE, MNIT
Date of publication, distribution, etc. 2009
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element PROJECT REPORT
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element RENU AGRAWAL
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element TEST SCHEME FOR FLASH MEMORY ARRAY
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element VLSI
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element ELECTRONICS AND COMMUNICATION ENGINEERING
690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN)
Topical term or geographic name as entry element ELECTRONICS AND COMMUNICATION ENGINEERING
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name SAHULA, VINEET ; KUMAWAT, RENU
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 64399
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Dewey Decimal Classification     Malaviya National Institute of Technology Malaviya National Institute of Technology 07/01/2014   EV066 15/04/2014 15/04/2014 Project Reports