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Wafer-Level Testing and During Burn-in for Integrated Circuits

By: BAHUKUDUMBI, SUDARSHAN.
Contributor(s): CHAKRABARTY, KRISHNENDU.
Material type: materialTypeLabelBookPublisher: London Artech House 2010Description: xv,198p.ISBN: 9781596939899.Subject(s): INTEGRATED CIRCUITS--WAFER-SCALE INTEGRATION | ELECTRONICS AND COMMUNICATION ENGINEERINGDDC classification: 621.3815
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Item type Current location Call number Status Date due Barcode
General Books General Books Malaviya National Institute of Technology
621.3815 BAH (Browse shelf) Available 79139

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