Wafer-Level Testing and During Burn-in for Integrated Circuits
By: BAHUKUDUMBI, SUDARSHAN.
Contributor(s): CHAKRABARTY, KRISHNENDU.
Material type:
BookPublisher: London Artech House 2010Description: xv,198p.ISBN: 9781596939899.Subject(s): INTEGRATED CIRCUITS--WAFER-SCALE INTEGRATION | ELECTRONICS AND COMMUNICATION ENGINEERINGDDC classification: 621.3815
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
General Books
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Malaviya National Institute of Technology | 621.3815 BAH (Browse shelf) | Available | 79139 |
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