Wafer-Level Testing and During Burn-in for Integrated Circuits
Material type: TextPublication details: London Artech House 2010 Description: xv,198pISBN: 9781596939899Subject(s): INTEGRATED CIRCUITS--WAFER-SCALE INTEGRATION | ELECTRONICS AND COMMUNICATION ENGINEERINGDDC classification: 621.3815Item type | Current library | Call number | Status | Date due | Barcode |
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General Books | Malaviya National Institute of Technology | 621.3815 BAH (Browse shelf(Opens below)) | Available | 79139 |
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