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Field -Ion Microscopy edited by HREN, JOHN J. ; RANGANATHAN, S.

Contributor(s): HREN, JOHN J. ; RANGANATHAN, SMaterial type: TextTextPublication details: NEW YORK PLENUM PRESS 1968 Subject(s): FIELD EMISSION AND FIELD | METALLURGICAL AND MATERIALS ENGINEERING | METALLURGICAL AND MATERIALS ENGINEERINGDDC classification: F191:(C5)
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Holdings
Item type Current library Call number Status Date due Barcode
General Books General Books Malaviya National Institute of Technology
F191:(C5) HRE (Browse shelf(Opens below)) Available 14980

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