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		No cover image available SYSTEM ON CHIP TEST ARCHITECTURES NANOMETER DESIGN FOR TESTABILITY by WANG , LAUNG TERNG \| TOUBA, NUR A \| STROUD, CHARLES E. Material type: Text; Format: print ; Literary form: Not fiction Publication details: New Delhi Elsevier 2008Availability: Items available for loan: Malaviya National Institute of Technology (1)Call number: 621.395 WAN. Add to cart (remove)
		System-on-chip test architectures : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba. by Wang, Laung-Terng \| Stroud, Charles E \| Touba, Nur A. Series: The Morgan Kaufmann series in systems on siliconMaterial type: Text; Format: print ; Literary form: Not fiction Publication details: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008Availability: Items available for reference: Malaviya National Institute of Technology: Not for loan (1)Call number: 621.395. Add to cart (remove)

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