LSI/VLSI Testability Design
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TextPublication details: Delhi McGraw-Hill 1987 Description: 702pSubject(s): INTEGRATED CIRCUITS-VERY LARGE SCALE | INTEGRATED CIRCUITS -LARGE SCALE INTEGRATION-TESTING | ELECTRICAL ENGINEERINGDDC classification: 621.3950287
| Item type | Current library | Call number | Status | Date due | Barcode |
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General Books
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Malaviya National Institute of Technology | 621.3950287 TSU (Browse shelf(Opens below)) | Available | 41956 |
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| 621.384 REE Software Radio | 621.392 FRA Electric Circuits Fundamentals | 621.395 VIS Vlsi Technology | 621.3950287 TSU LSI/VLSI Testability Design | 621.4023 ANN Combustion Science and Engineering | 621.406 YAH Turbomachines | 621.4712 SUK SOLAR ENERGY |
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