System-on-chip test architectures : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
Material type: TextSeries: The Morgan Kaufmann series in systems on siliconPublication details: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008. Description: xxxvi, 856 p. : ill. ; 25 cmISBN: 9780123739735 (hardcover : alk. paper)Subject(s): Systems on a chip -- Testing | Integrated circuits -- Very large scale integration -- Testing | Integrated circuits -- Very large scale integration -- DesignDDC classification: 621.395Item type | Current library | Call number | Status | Date due | Barcode |
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REFERENCE | Malaviya National Institute of Technology Reference | 621.395 (Browse shelf(Opens below)) | Not for loan | 73568 |
Includes bibliographical references and index.
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